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XRD workshop about Rietveld method with MAUD software
3 juli, 2017, 10:00 - 7 juli, 2017, 17:00
The 8th session of this workshop will take place in Caen France from July 3rd to July 7th, 2017.
The training will cover many aspects of “Combined Analysis” by X-ray and neutron scattering, ranging from fundamental requirements to technically relevant industrial and academic applications : Diffraction technique – an overview, crystallography Texture Analysis, Residual Stress Analysis, Rietveld analysis, Reflectivity analysis, Phase analysis, Phase and line broadening analysis, The combined solution, XRD and XRF combined analysis, Electron Microscopy, Using MAUD software…
For more informations about MAUD software, please visit the website: http://maud.radiographema.eu/
For more information about the workshop, please contact us
Daniel Chateigner Professor, CRISMAT Laboratory, Caen, France : scientific coordinator, firstname.lastname@example.org
Eric Berthier, THERMO FISHER SCIENTIFIC company, INEL brand : organization coordinator, email@example.com